On December 9, 2016, Chief Judge Ryuichi Shitara of the IP High Court participated in the Japan-China-Korea IP Symposium hosted by the JPO, the KIPO, and the SIPO. Chief Judge Shitara participated in a session entitled “Latest trends in IP lawsuits in Japan, China and South Korea” and gave a speech on the state of handling cases at the IP High Court, Grand Panel cases, international exchanges, international information transmission and future prospects under the title “Latest Trends in Intellectual Property Lawsuits in Japan”. Then, Chief Judge Shitara participated in a panel discussion moderated by Mr. Ryu Takabayashi, Professor, School of Law, Waseda University with Dr. Park Taeil, Research Judge, Presiding/Senior Judge in charge of IP Rights, Supreme Court of Korea and Ms. MA Wenxia, Director, Administrative Litigation Division of Patent Reexamination Board of SIPO and discussed the perspectives on product-by-process claims.