Three in One: Global Patent Trials, Held in New York

On April 18, 2019, IP High Court Chief Judge Makiko Takabe attended "Three in One: Global Patent Trials," an event held at Ceremonial Courtroom of Daniel Patrick Moynihan Courthouse, in New York, the United States. This event was sponsored by American Inns of Court Foundation (Linn Inn Alliance, Hon William C. Conner American Inn of Court), and co-sponsored by AIPPI Japan, Fordham Law School IP Institute, Japan Patent Office, New Jersey Intellectual Property Law Association, and New York Intellectual Property Law Association.
At the event, mock trials were held by the teams from Japan, Germany, and the United States in this order, followed by a panel discussion session by the patent administrative judges and businesspersons from Japan and those from the United States regarding Post Grant Review, and at the end of the event, a panel discussion session was held by all speakers including the court judges, under the title of "Comparative Law Summaries, Q&A." Chief Judge Takabe served as the chief judge at Japan's mock trial and participated in the panel discussion sessions as a panelist. The outline of the arguments and judgment in Japan's mock trial is available in the reference material, "Japan Litigation" (PDF448KB). This event was also attended by Prof. Dr. Peter Meier-Beck, Chief Judge of the German Federal Court of Justice, Mr. Richard Linn, Circuit Judge of the United States Court of Appeals for the Federal Circuit (CAFC), and Mr. J. Paul Oetken, judge of the United States District Court for the Southern District of New York, with participation of lawyers specialized in IP litigation and patent attorneys from Japan, Germany and the United States, as well as patent administrative judges and businesspersons from the United States and Japan. All these guests and participants engaged in active debates.

image1:Three in One: Global Patent Trials

image2:Three in One: Global Patent Trials

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